- East Africa Law Society
- Law Society of Kenya
- Email: [email protected]
- Telephone: +254 20 4440891/2
- Fax: +254 20 4440893
- Website: http://www.cfllegal.com
Managing Partner at CFL Advocates
Lorna Mbatia is a founding partner at CFL Advocates and head of the firm’s IP Law Department. She is dual-qualified and registered as a trademark and patent agent in both Kenya and Rwanda.
She has expertise in all areas of intellectual property, both contentious and non-contentious, across East Africa, ARIPO, OAPI and International filing systems. She also offers advice on commercial aspects of intellectual property, including licensing and distribution, franchising, and the IP aspects of mergers and acquisitions.
Ms Mbatia further counsels domestic and international manufacturers on anti-counterfeiting initiatives. She has led and coordinated a multinational on-trade survey which covered Kenya, Uganda, Tanzania and Burundi.
As a member of the Legal and Regulatory Committee of the Kenya Association of Manufacturers, INTA’s Anticounterfeiting Committee (Middle East and Africa Subcommittee) and INTA’s Africa Global Advisory Council, Ms Mbatia has been involved in drafting and reviewing laws and policies governing IP rights across East Africa.
She has spoken extensively and provided training on various IP topics on numerous occasions, including the INTA annual meeting and conferences, the Kenya Council of Legal Education Seminars, Marcus Evans legal training seminars and various corporate in-house counsel seminars.
Ms Mbatia has been ranked in the WTR 1000 since 2012, where she has been commended for having a keen strategic eye and a quick turnaround time, and providing sensible, concise and accurate information and advice. She has also been ranked as an IP leader by the World Intellectual Property Review.
Ms Mbatia is also a recipient of the International Law Office 2014 Client Choice Award for Intellectual Property – Trademarks in Kenya and is listed as an IP Star in the 2014-2019 Managing Intellectual Property World IP Surveys.